Inside the event > Short courses

 X-Ray Photoelectron Spectroscopy (XPS/ESCA) - John T. Grant / 2 days: Sun. 24 & Mon. 25 Sept.


The courses are being taught by John T. Grant, who has over 40 years experience in surface analysis, and who has been teaching such courses for many years. He had been a Distinguished Research Scientist at the University of Dayton for over 30 years. He is now a consultant in surface science. He is co-editor of the book: Surface Analysis by Auger and X-ray Photoelectron Spectroscopy.


Who Should Attend?

Scientists, engineers, technicians, and students, who would like a detailed understanding of the principles and uses of XPS/ESCA for surface analysis and depth profiling.

Description and Objectives

XPS is used to determine the atoms present at a surface and their concentrations, chemistry, and lateral and depth distributions. This course is designed for scientists, engineers, technicians, and students, who would like a detailed understanding of the principles and uses of XPS/ESCA for surface analysis and depth profiling. Topics include the principles of XPS, instrumentation, qualitative analysis, quantitative analysis, artifacts, data acquisition and processing, imaging, and depth profiling.

Course Materials

Printed copy of all slides 


Day 1: 24 September 2017, 09:30-12:30 and 13:30-17:00

  • Introduction - terminology, surfaces, types of surfaces.
  • The principles of XPS - production of photoelectrons, peak labeling, electronic configuration of atoms, atoms, molecules, solids, binding energy, spectra, Auger process, valence spectra, surface sensitivity, information depth, sample handling, spin-orbit splitting, chemical shift, plasmons, multiplet splitting, shake-up.
  • Instrumentation - dual anode, Bremsstrahlung, monochromatic source, electron energy analyzers, spectrum acquisition, energy resolution, scattering in analyzers, electron detectors, pulse counting, position sensitive detectors, small area analysis, area location, imaging XPS, methods, equipment and examples, vacuum system, samples, energy scale calibration.

Day 2: 25 September 2017, 09:00-12:00 and 13:30-16:30

  • Qualitative analysis - identification of elements, changing x-ray sources, charging, interpretation of chemical shift, relaxation effects, Auger parameter, peak widths, lineshapes.
  • Quantitative analysis - sensitivity factors, ionization cross section, asymmetry parameter, analyzer transmission, reference spectra, intensities, background subtraction, detection limit, effect of thin overlayers.
  • Artifacts - x-ray damage, charging, methods for charge control, ghost peaks.
  • Data acquisition and processing - processing data, background subtraction, satellite subtraction, peak area, lineshapes, curve fitting, deconvolution.
  • Depth profiling - non-destructive and destructive methods, angle resolved XPS, diffraction, elastic scattering, thickogram, inelastic loss method, sputtering, depth calibration.
  • Applications - some further examples of applications of XPS.
  • Instrument selection and summary - factors to consider, general summary. 



Through the kind sponsorship of IUVSTA, a reduced fee will be available for participants of the IUVSTA Short Course.

To apply for the reduced fee please send an email to the Conference secretary with the Subject: "Application for the IUVSTA Short course Grant" and containing a short information about applicant: name, nationality, research/study institution, year of PhD study, research interests.

If the number of applications exceeds the number of available grants, priority will be given to participants coming from less developed countries.

Application process wil open until June 16thInformation about results of qualification will be sent to applicants before June 27th. It is expected that successful applicants will pay the reduced IUVSTA Short Course registration fee before July 7th, 2017. Otherwise, the grant will be allocated to the next person on the waiting list.

Note: The applicants are kindly asked to register only after receiving notification about results of qualification.

Registration fees

Type of registration Profile Early Bird Reg.
Before 7 July 2017
Regular Reg.
Before 4 Sept. 2017
Late Reg.
After 4 Sept. 2017
   Short courses #1
      John Grant
   Standard € 500 € 550 € 600
   Student * € 300 € 350 € 400
   Package #1
      Short course #1 & Conferences
   Standard € 800 € 900 € 950
   Student * € 550 € 600 € 650

*A proof of your student condition is required in the online form when you register





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